75 citations · 174 across the 8 of their papers we have counts for
9 papers
Imaging moiré deformation and dynamics in twisted bilayer graphene
Tobias A. de Jong, Tjerk Benschop, Xingchen Chen +5
In twisted bilayer graphene (TBG) a moiré pattern forms that introduces a new length scale to the material. At the 'magic' twist angle of 1.1°, this causes a flat band to form, yie…
Optical Near-Field Electron Microscopy
Raphaël Marchand, Radek Šachl, Martin Kalbáč +5
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide…
Complementary LEEM and eV-TEM for imaging and spectroscopy
Peter S. Neu, Daniël Geelen, Aniket Thete +2
Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional tr…
Low-Energy Electron Potentiometry
Johannes Jobst, Jaap Kautz, Maria Mytiliniou +1
In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniqu…
Patterning Sn-based EUV resists with low-energy electrons
Ivan Bespalov, Yu Zhang, Jarich Haitjema +5
Extreme Ultraviolet (EUV) lithography is the newest technology that will be used in the semiconductor industry for printing circuitry in the sub-20 nm scale. Low-energy electrons (…
Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis
Tobias A. de Jong, David N. L. Kok, Alexander J. H. van der Torren +4
For many complex materials systems, low-energy electron microscopy (LEEM) offers detailed insights into morphology and crystallography by naturally combining real-space and recipro…
Quantifying work function differences using low-energy electron microscopy: the case of mixed-terminated strontium titanate
Johannes Jobst, Laurens M. Boers, Chunhai Yin +3
For many applications, it is important to measure the local work function of a surface with high lateral resolution. Low-energy electron microscopy is regularly employed to this en…
The Equilibrium Shape of Graphene Domains on Ni(111)
Meifang Li, J. B. Hannon, R. M. Tromp +4
We have determined the equilibrium shape of graphene domains grown on Ni(111) via carbon segregation at 925°C. In situ, spatially-resolved electron diffraction measurements were us…
Intrinsic Instability of Aberration-Corrected Electron Microscopes
S. M. Schramm, S. J. van der Molen, R. M. Tromp
Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state…