75 citations · 174 across the 8 of their papers we have counts for
3 papers · 1 filter
Low-Energy Electron Potentiometry
Johannes Jobst, Jaap Kautz, Maria Mytiliniou +1
In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniqu…
Patterning Sn-based EUV resists with low-energy electrons
Ivan Bespalov, Yu Zhang, Jarich Haitjema +5
Extreme Ultraviolet (EUV) lithography is the newest technology that will be used in the semiconductor industry for printing circuitry in the sub-20 nm scale. Low-energy electrons (…
Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis
Tobias A. de Jong, David N. L. Kok, Alexander J. H. van der Torren +4
For many complex materials systems, low-energy electron microscopy (LEEM) offers detailed insights into morphology and crystallography by naturally combining real-space and recipro…