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20182021
most citedQuantifying work function differences using low-energy electron microscopy: the case of mixed-terminated strontium titanate

20 citations · 24 across the 3 of their papers we have counts for

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2 papers · 1 filter

physics.app-ph2021

Optical Near-Field Electron Microscopy

Raphaël Marchand, Radek Šachl, Martin Kalbáč +5

Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide…

physics.app-ph2019★ 1 cited

Patterning Sn-based EUV resists with low-energy electrons

Ivan Bespalov, Yu Zhang, Jarich Haitjema +5

Extreme Ultraviolet (EUV) lithography is the newest technology that will be used in the semiconductor industry for printing circuitry in the sub-20 nm scale. Low-energy electrons (…