Intrinsic Instability of Aberration-Corrected Electron Microscopes
arXiv:1209.5340 · doi:10.1103/PhysRevLett.109.163901
Abstract
Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state is just a few minutes. Here we show that the corrected state is intrinsically unstable; the higher its quality, the more unstable it is. Analyzing the Contrast Transfer Function near optimum correction, we define an 'instability budget' which allows a rational trade-off between resolution and stability. Unless control systems are developed to overcome these challenges, intrinsic instability poses a fundamental limit to the resolution practically achievable in the electron microscope.
accepted, Physical Review Letters
Cited by in corpus (3)
- Leveraging generative adversarial networks to create realistic scanning transmission electron microscopy images
- Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging