570 citations · 1.4k across the 16 of their papers we have counts for
17 papers
Optical Near-Field Electron Microscopy
Raphaël Marchand, Radek Šachl, Martin Kalbáč +5
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide…
Complementary LEEM and eV-TEM for imaging and spectroscopy
Peter S. Neu, Daniël Geelen, Aniket Thete +2
Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional tr…
Low-Energy Electron Potentiometry
Johannes Jobst, Jaap Kautz, Maria Mytiliniou +1
In a lot of systems, charge transport is governed by local features rather than being a global property as suggested by extracting a single resistance value. Consequently, techniqu…
Quantifying work function differences using low-energy electron microscopy: the case of mixed-terminated strontium titanate
Johannes Jobst, Laurens M. Boers, Chunhai Yin +3
For many applications, it is important to measure the local work function of a surface with high lateral resolution. Low-energy electron microscopy is regularly employed to this en…
Optical tracing of multiple charges in single-electron devices
Sanli Faez, Sense Jan van der Molen, Michel Orrit
Single molecules that exhibit narrow optical transitions at cryogenic temperatures can be used as local electric-field sensors. We derive the single charge sensitivity of aromatic…
Intrinsic Instability of Aberration-Corrected Electron Microscopes
S. M. Schramm, S. J. van der Molen, R. M. Tromp
Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state…