Inevitable Si surface passivation prior to III-V/Si epitaxy: A strong impact on wetting properties
arXiv:2312.01412 · doi:10.1103/PhysRevB.109.045304
Abstract
Here, we quantitatively estimate the impact of the inevitable Si surface passivation prior to III-V/Si hetero-epitaxy on the surface energy of the Si initial substrate, and explore its consequences for the description of wetting properties. Density Functional Theory is used to determine absolute surface energies of P- and Ga-passivated Si surfaces and their dependencies with the chemical potential. Especially, we show that, while a ~90 meV/ surface energy is usually considered for the nude Si surface, surface passivation by Ga- or P- atoms leads to a strong stabilization of the surface, with a surface energy in the [50-75 meV/] range. The all-ab initio analysis of the wetting properties indicate that a complete wetting situation would become possible only if the initial passivated Si surface could be destabilized by at least 15 meV/ or if the III-V (001) surface could be stabilized by the same amount.
arXiv comment6 pages, 4 figures
References in corpus (6)
- The SIESTA method for ab initio order-N materials simulation
- Efficient index handling of multidimensional periodic boundary conditions
- A universal description of III-V/Si epitaxial growth processes
- Zinc-Blende group III-V/group IV epitaxy: importance of the miscut
- Antiphase boundaries in III-V semiconductors: Atomic configurations, band structures and Fermi levels
- Determination of III-V/Si absolute interface energies: impact on wetting properties