High-Fidelity Ion State Detection Using Trap-Integrated Avalanche Photodiodes
arXiv:2202.01715 · doi:10.1103/PhysRevLett.129.100502
Abstract
Integrated technologies greatly enhance the prospects for practical quantum information processing and sensing devices based on trapped ions. High-speed and high-fidelity ion state readout is critical for any such application. Integrated detectors offer significant advantages for system portability and can also greatly facilitate parallel operations if a separate detector can be incorporated at each ion-trapping location. Here we demonstrate ion quantum state detection at room temperature utilizing single-photon avalanche diodes (SPADs) integrated directly into the substrate of silicon ion trapping chips. We detect the state of a trapped ion via fluorescence collection with the SPAD, achieving average fidelity in 450 s, opening the door to the application of integrated state detection to quantum computing and sensing utilizing arrays of trapped ions.
7 pages, 5 figures
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- Ion Trap with In-Vacuum High Numerical Aperture Imaging for a Dual-Species Modular Quantum Computer
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- Test and characterization of multilayer ion traps on fused silica
- Trap-integrated fluorescence detection based on silicon photomultipliers in a cryogenic Penning trap
- Fault Localization in a Microfabricated Surface Ion Trap using Diamond Nitrogen-Vacancy Center Magnetometry
- Scalable chip-based 3D ion traps