Integrated optical addressing of a trapped ytterbium ion

Abstract

We report on the characterization of heating rates and photo-induced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here we characterize the delivery of 435 nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of $0.78\pm 0.05$ q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.

arXiv comment7 pages, 8 figures

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• Fluorescence Detection of a Trapped Ion with a Monolithically Integrated Single-Photon-Counting Avalanche Diode
• High-Fidelity Ion State Detection Using Trap-Integrated Avalanche Photodiodes
• Multi-site Integrated Optical Addressing of Trapped Ions
• High-fidelity trapped-ion qubit operations with scalable photonic modulators
• Penning micro-trap for quantum computing
• Control of an atomic quadrupole transition in a phase-stable standing wave
• Rapid Exchange Cooling with Trapped Ions
• Optimization and implementation of a surface-electrode ion trap junction
• Fabrication of Surface Ion Traps with Integrated Current Carrying Wires enabling High Magnetic Field Gradients
• A Fully Fiber-Integrated Ion Trap for Portable Optical Atomic Clocks