Fluorescence Detection of a Trapped Ion with a Monolithically Integrated Single-Photon-Counting Avalanche Diode

Abstract

We report on the first demonstration of fluorescence detection using single-photon avalanche photodiodes (SPADs) monolithically integrated with a microfabricated surface ion trap. The SPADs are positioned below the trapping positions of the ions, and designed to detect 370 nm photons emitted from single ${}^{174}$Yb${}^{+}$ and ${}^{171}$Yb${}^{+}$ ions. We achieve an ion/no-ion detection fidelity for ${}^{174}$Yb${}^{+}$ of 0.99 with an average detection window of 7.7(1) ms. We report a dark count rate as low as 1.2 kHz at room temperature operation. The fidelity is limited by laser scatter, dark counts, and heating that prevents holding the ion directly above the SPAD. We measure count rates from each of the contributing sources and fluorescence as a function of ion position. Based on the active detector area and using the ion as a calibrated light source we estimate a SPAD quantum efficiency of 24$\pm$1%.

6 Pages, 6 Figures

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• High-fidelity laser-free universal control of two trapped ion qubits
• High-Fidelity Ion State Detection Using Trap-Integrated Avalanche Photodiodes
• High-fidelity trapped-ion qubit operations with scalable photonic modulators
• Fabrication of Surface Ion Traps with Integrated Current Carrying Wires enabling High Magnetic Field Gradients
• A Fully Fiber-Integrated Ion Trap for Portable Optical Atomic Clocks