Nanoscale Non-Destructive Ferroelectric Characterization with Non-Contact Heterodyne Electrostrain Force Microscopy
arXiv:2105.03088 · doi:10.1002/smtd.202100639
Abstract
Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse Force Microscopy (PFM), however, the fundamental limitations of PFM have made the nanoscale ferroelectric studies encounter significant bottlenecks. In this study, a high-resolution non-contact ferroelectric measurement, named Non-Contact Heterodyne Electrostrain Force Microscopy (NC-HEsFM), has been introduced firstly. It has been unambiguously demonstrated that NC-HEsFM can operate on multiple eigenmodes to perform ideal high-resolution ferroelectric domain mapping, standard ferroelectric hysteresis loop measurement and controllable domain manipulation. With using quartz tuning fork (QTF) sensor and heterodyne detection, NC-HEsFM shows an unprecedented capability in achieving real non-contact yet non-destructive ferroelectric characterization with negligible electrostatic force effect. It is believed that NC-HEsFM can be extensively used in various ferroelectric or piezoelectric studies with providing substantially improved characterization performance. Meanwhile, the QTF-based force detection makes NC-HEsFM highly compatible for high-vacuum and low-temperature environments, providing ideal conditions for achieving an ultra-high spatial resolution to investigate the most intrinsic ferroelectric phenomena.
arXiv commentMain Text 30 pages, 5 figures; Supplemetary Materials:18 pages, 10 Figures and 1 Table
References in corpus (24)
- Physics of thin-film ferroelectric oxides
- Advances in atomic force microscopy
- Ab initio study of ferroelectric domain walls in PbTiO3
- Dual-Frequency Resonance-Tracking Atomic Force Microscopy
- The Band Excitation Method in Scanning Probe Microscopy for Rapid Mapping of Energy Dissipation on the Nanoscale
- A Decade of Piezoresponse Force Microscopy: Progress, Challenges and Opportunities
- Non-piezoelectric effects in piezoresponse force microscopy
- Dynamic Behavior in Piezoresponse Force Microscopy
- Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy
- Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy
- A comparsion of force sensors for atomic force microscopy based on quartz tuning forks and length extensional resonators
- Spatially Resolved Mapping of Local Polarization Dynamics in an Ergodic Phase of Ferroelectric Relaxor
- Piezoresponse Force Spectroscopy of Ferroelectric Materials
- Optimizing atomic resolution of force microscopy in ambient conditions
- Quantification of Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy
- In-situ Piezoresponse Force Microscopy Cantilever Mode Shape Profiling
- Quardratic Electromechanical Strain in Silicon Investigated by Scanning Probe Microscopy
- Towards local electromechanical probing of cellular and biomolecular systems in a liquid environment
- Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies
- Electrostatic effect on off-field ferroelectric hysteresis loop in piezoresponse force microscopy
- More ferroelectrics discovered by switching spectroscopy piezoresponse force microscopy?
- Simultaneous current-, force- and work function measurement with atomic resolution
- A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz
- Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy