A Decade of Piezoresponse Force Microscopy: Progress, Challenges and Opportunities
arXiv:cond-mat/0509009 · doi:10.1109/TUFFC.2006.169
Abstract
Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes. Understanding electromechanical functionality in materials such as ferroelectric nanocrystals, thin films, relaxor ferroelectrics, and biosystems requires probing these properties on the nanometer level of individual grain, domain, or protein fibril. In the last decade, Piezoresponse Force Microscopy (PFM) was established a powerful tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric and piezoelectric materials. Here, we present principles and recent advances in PFM, including vector and frequency dependent imaging of piezoelectric materials, briefly review applications for ferroelectric materials, discuss prospects for electromechanical imaging of local crystallographic and molecular orientations and disorder, and summarize future challenges and opportunities for PFM emerging in the second decade since its invention.
76 pages, 18 figures, This work has been submitted to the IEEE for possible publication
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- Quardratic Electromechanical Strain in Silicon Investigated by Scanning Probe Microscopy
- Extrinsic Size Effect in Piezoresponse Force Microscopy of Thin Films
- A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz
- Interferometric Imaging of Nonlocal Electromechanical Power Transduction in Ferroelectric Domains
- Unsupervised learning of ferroic variants from atomically resolved STEM images
- Nanoscale Non-Destructive Ferroelectric Characterization with Non-Contact Heterodyne Electrostrain Force Microscopy
- Nanoscale electrical measurements in liquids using AFM - progress and outlook
- Diminish Electrostatic in Piezoresponse Force Microscopy through longer ultra-stiff tips
- Resetting Piezoresponse Force Microscopy: Towards a real quantitative technique
- Multiple-Modes Scanning Probe Microscopy Characterization of Copper doped Zinc Oxide (ZnO:Cu) Thin Films