collaborators

1 paper

cond-mat.mtrl-sci2001

Quantitative Comparison between AES and SIMS Depth Profiles of a Double Layer Structure of AlAs in GaAs Using the MRI-model

S. Hofmann, A. Rar, D. W. Moon +1

Application of the so called mxing-roughness-information depth (MRI)-model to the quantitative reconstruction of the in-depth distribution of composition is demonstrated by compari…