Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

Abstract

Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

15 pages, 5 figures, 3 tables, Supplementary materials

References in corpus (3)

• Electromechanical Detection in Scanning Probe Microscopy: Tip Models and Materials Contrast
• The Piezoresponse Force Microscopy of surface layers and thin films: effective response and resolution function
• Towards local electromechanical probing of cellular and biomolecular systems in a liquid environment

Cited by in corpus (1)

• Quantification of Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy