Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

Abstract

Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

15 pages, 5 figures, 3 tables, Supplementary materials

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• Disentangling stress and curvature effects in layered 2D ferroelectric CuInP2S6
• A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz
• Lagrangian and impedance spectroscopy treatments of electric force microscopy
• Nanoscale Non-Destructive Ferroelectric Characterization with Non-Contact Heterodyne Electrostrain Force Microscopy