activity
20032025
most citedQuantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

120 citations · 507 across the 17 of their papers we have counts for

collaborators

19 papers

physics.plasm-ph2025

Toward the Origins of Binding Energy Shifts and Satellites Formation During Plasma-XPS Measurements

J. Trey Diulus, Ashley R. Head, Jorge Anibal Boscoboinik +3

In plasma X ray photoelectron spectroscopy emerges as a powerful platform for real time, in situ chemical analysis under conditions relevant to semiconductor processing and other p…

cond-mat.mtrl-sci2025

Defect Engineering in Large-Scale CVD-Grown Hexagonal Boron Nitride: Formation, Spectroscopy, and Spin Relaxation Dynamics

Ivan V. Vlassiouk, Yueh-Chun Wu, Alexander Puretzky +19

Recently, numerous techniques have been reported for generating optically active defects in exfoliated hexagonal boron nitride (hBN), which hold transformative potential for quantu…

physics.app-ph2022

Polarization-controlled volatile ferroelectric and capacitive switching in SnPS

Sabine M. Neumayer, Anton V. Ievlev, Alexander Tselev +4

Smart electronic circuits that support neuromorphic computing on the hardware level necessitate materials with memristive, memcapacitive, and neuromorphic-like functional propertie…

physics.app-ph2020

Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

Hongxuan Guo, Alexander Yulaev, Evgheni Strelcov +5

Electrical double layers play a key role in a variety of electrochemical systems. The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, mak…

cond-mat.mtrl-sci2020

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

K. N. Romanuk, D. O. Alikin, B. N. Slautin +3

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurem…

physics.app-ph2019

Piezoresponse phase as variable in electromechanical characterization

Sabine M. Neumayer, Sahar Saremi, Lane W. Martin +5

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local p…