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20032025
most citedQuantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

120 citations · 507 across the 17 of their papers we have counts for

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cond-mat.mtrl-sci2025

Defect Engineering in Large-Scale CVD-Grown Hexagonal Boron Nitride: Formation, Spectroscopy, and Spin Relaxation Dynamics

Ivan V. Vlassiouk, Yueh-Chun Wu, Alexander Puretzky +19

Recently, numerous techniques have been reported for generating optically active defects in exfoliated hexagonal boron nitride (hBN), which hold transformative potential for quantu…

cond-mat.mtrl-sci2020

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

K. N. Romanuk, D. O. Alikin, B. N. Slautin +3

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurem…

cond-mat.mtrl-sci2018

Learning from imperfections: constructing phase diagrams from atomic imaging of fluctuations

Lukas Vlcek, Maxim A. Ziatdinov, Alexander Tselev +3

Materials characterization and property measurements are a cornerstone of material science, providing feedback from synthesis to applications. Traditionally, a single sample is use…

cond-mat.mtrl-sci2018★ 74 cited

Giant negative electrostriction and dielectric tunability in a van der Waals layered ferroelectric

Sabine M. Neumayer, Eugene A. Eliseev, Michael A. Susner +11

The interest in ferroelectric van der Waals crystals arises from the potential to realize ultrathin ferroic systems owing to the reduced surface energy of these materials and the l…

cond-mat.mtrl-sci2018

In aqua electrochemistry probed by XPEEM: experimental setup, examples, and challenges

Slavomír Nemšák, Evgheni Strelcov, Hongxuan Guo +8

Recent developments in environmental and liquid cells equipped with electron transparent graphene windows have enabled traditional surface science spectromicroscopy tools, such as…

cond-mat.mtrl-sci2016★ 120 cited

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Nina Balke, Stephen Jesse, Pu Yu +3

Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enha…