Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit
arXiv:2011.04375 · doi:10.1140/epjs/s11734-021-00071-7
Abstract
We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence , strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.
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