Second spectrum of charge carrier density fluctuations in graphene due to trapping/detrapping processes
arXiv:2305.07628 · doi:10.1063/5.0157327
Abstract
We investigate the second spectrum of charge carrier density fluctuations in graphene within the McWorther model, where noise is induced by electron traps in the substrate. Within this simple picture, we obtain a closed-form expression including both Gaussian and non-Gaussian fluctuations. We show that a very extended distribution of switching rates of the electron traps in the substrate leads to a carrier density power spectrum with a non-trivial structure on the scale of the measurement bandwidth. This explains the appearance of a component in the Gaussian part of the second spectrum, which adds up to the expected frequency-independent term. Finally, we find that the non-Gaussian part of the second spectrum can become quantitatively relevant by approaching extremely low temperatures.
10 pages, 2 figures
References in corpus (8)
- Graphene Nano-Ribbon Electronics
- Strong Suppression of Electrical Noise in Bilayer Graphene Nano Devices
- Electronic Structure of gated graphene and graphene ribbons
- Nonequilibrium Spin Noise and Noise of Susceptibility
- Effect of boron nitride defects and charge inhomogeneity on 1/f noise in encapsulated graphene
- Charge carrier density noise in graphene: effect of localized/delocalized traps
- Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit
- Suppression of noise in graphene due to non-scalar mobility fluctuations induced by impurity motion