Josephson inductance as a probe for highly ballistic semiconductor-superconductor weak links
arXiv:2007.08371 · doi:10.1103/PhysRevLett.126.037001
Abstract
We present simultaneous measurements of Josephson inductance and DC transport characteristics of ballistic Josephson junctions based upon an epitaxial Al-InAs heterostructure. The Josephson inductance at finite current bias directly reveals the current-phase relation. The proximity-induced gap, the critical current and the average value of the transparency are extracted without need for phase bias, demonstrating, e.g.,~a near-unity value of . Our method allows us to probe the devices deeply in the non-dissipative regime, where ordinary transport measurements are featureless. In perpendicular magnetic field the junctions show a nearly perfect Fraunhofer pattern of the critical current, which is insensitive to the value of . In contrast, the signature of supercurrent interference in the inductance turns out to be extremely sensitive to .
13 pages, 13 figures
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- Near-surface InAs 2DEG on a GaAs substrate: characterization and superconducting proximity effect
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- Flip-chip-based fast inductive parity readout of a planar superconducting island
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