Layer Dependent Interfacial Transport and Optoelectrical Properties of MoS2 on Ultra-flat Metals
arXiv:1908.00609 · doi:10.1021/acsami.9b09868
Abstract
Transition metal dichalcogenides (TMDs) are layered semiconducting van der Waal crystals and promising materials for a wide range of electronic and optoelectronic devices. Realizing practical electrical and optoelectronic device applications requires a connection between a metal junction and a TMD semiconductor. Hence, a complete understanding of electronic band alignments and the potential barrier heights governing the transport through a metal-TMD-metal junction is critical. But, there is a knowledge gap; it is not clear how the energy bands of a TMD align while in contact with a metal as a function of the number of layers. In pursuit of removing this knowledge gap, we have performed conductive atomic force microscopy (CAFM) of few layered (1-5) MoS2 immobilized on ultra-flat conducting Au surfaces (root mean square (RMS) surface roughness <0.2 nm) and indium tin oxide (ITO) substrate (RMS surface roughness <0.7 nm) forming a vertical metal (conductive-AFM tip)-semiconductor-metal device. We have observed that the current increases as the number of layers increases up to 5 layers. By applying Fowler-Nordheim tunneling theory, we have determined the barrier heights for different layers and observed that the barrier height decreases as the number of layers increases. Using density functional theory (DFT) calculation, we successfully demonstrated that the barrier height decreases as the layer number increases. By illuminating the TMDs on a transparent ultra-flat conducting ITO substrate, we observed a reduction in current when compared to the current measured in the dark, hence demonstrating negative photoconductivity. Our study provides a fundamental understanding of the local electronic and optoelectronic behaviors of TMD-metal junction, and may pave an avenue toward developing nanoscale electronic devices with tailored layer-dependent transport properties.
arXiv comment11 pages, 5 figures
References in corpus (17)
- Atomically thin MoS2: A new direct-gap semiconductor
- Boron nitride substrates for high-quality graphene electronics
- Single-Layer MoS2 Phototransistors
- Two-Dimensional Material Nanophotonics
- Emerging Device Applications for Semiconducting Two-Dimensional Transition Metal Dichalcogenides
- Electrically Tunable Excitonic Light Emitting Diodes based on Monolayer WSe2 p-n Junctions
- Optoelectronics with electrically tunable PN diodes in a monolayer dichalcogenide
- Electroluminescence in Single Layer MoS2
- Improved Contacts to MoS2 Transistors by Ultra-High Vacuum Metal Deposition
- Probing excitonic states in ultraclean suspended two-dimensional semiconductors by photocurrent spectroscopy
- Trion induced negative photoconductivity in monolayer MoS2
- Elucidating the photoresponse of ultrathin MoS2 field-effect transistors by scanning photocurrent microscopy
- Temperature Dependent Thermal Boundary Conductance of Monolayer MoS by Raman Thermometry
- Investigation of Band-Offsets at Monolayer-Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy
- Carrier Transport at the Metal-MoS2 Interface
- Tunneling transport of mono- and few-layers magnetic van der Waals MnPS
- Determination of Carrier Polarity in Fowler-Nordheim Tunneling and Evidence of Fermi Level Pinning at the Hexagonal Boron Nitride / Metal Interface
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