A new elliptical-beam method based on time-domain thermoreflectance (TDTR) to measure the in-plane anisotropic thermal conductivity and its comparison with the beam-offset method
arXiv:1803.06551 · doi:10.1063/1.5029971
Abstract
Materials lacking in-plane symmetry are ubiquitous in a wide range of applications such as electronics, thermoelectrics, and high-temperature superconductors, in all of which the thermal properties of the materials play a critical part. However, very few experimental techniques can be used to measure in-plane anisotropic thermal conductivity. A beam-offset method based on time-domain thermoreflectance (TDTR) was previously proposed to measure in-plane anisotropic thermal conductivity. However, a detailed analysis of the beam-offset method is still lacking. Our analysis shows that uncertainties can be large if the laser spot size or the modulation frequency is not properly chosen. Here we propose an alternative approach based on TDTR to measure in-plane anisotropic thermal conductivity using a highly elliptical pump (heating) beam. The highly elliptical pump beam induces a quasi-one-dimensional temperature profile on the sample surface that has a fast decay along the short axis of the pump beam. The detected TDTR signal is exclusively sensitive to the in-plane thermal conductivity along the short axis of the elliptical beam. By conducting TDTR measurements as a function of delay time with the rotation of the elliptical pump beam to different orientations, the in-plane thermal conductivity tensor of the sample can be determined. In this work, we first conduct detailed signal sensitivity analyses for both techniques and provide guidelines in determining the optimal experimental conditions. We then compare the two techniques under their optimal experimental conditions by measuring the in-plane thermal conductivity tensor of a ZnO [11-20] sample. The accuracy and limitations of both methods are discussed.
arXiv comment35 pages, 12 figures, submitted to RSI
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Cited by in corpus (11)
- Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials
- A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity
- Simultaneous Measurement of Thermal Conductivity and Heat Capacity Across Diverse Materials Using the Square-Pulsed Source (SPS) Technique
- Decoupling Thermal Properties in Multilayer Systems for Advanced Thermoreflectance Techniques
- Three-Sensor 2ω Method with Multi-directional Layout: A General Methodology for Measuring Thermal Conductivity of Solid Materials
- Anisotropic Thermoreflectance Thermometry: A contactless frequency-domain approach to study anisotropic thermal transport
- Spatially resolved lock-in micro-thermography (SR-LIT): A tensor analysis-enhanced method for anisotropic thermal characterization
- Comprehensive Measurement of Three-Dimensional Thermal Conductivity Tensor Using a Beam-Offset Square-Pulsed Source (BO-SPS) Approach
- Three-dimensional (3D) tensor-based methodology for characterizing 3D anisotropic thermal conductivity tensor
- Length Dependence thermal conductivity of Zinc-Selenide (ZnSe) and Zinc Telluride (ZnTe)- A combined first principles and Frequency Domain Thermoreflectance (FDTR) study
- Strong Temperature Dependence of Thermal Conductivity in High-Purity Cubic Boron Arsenide