Three-dimensional (3D) tensor-based methodology for characterizing 3D anisotropic thermal conductivity tensor
arXiv:2501.07605 · doi:10.1016/j.ijheatmasstransfer.2025.126886
Abstract
The increasing complexity of advanced materials with anisotropic thermal properties necessitates more generic and efficient methods to determine three-dimensional (3D) anisotropic thermal conductivity tensors with up to six independent components. Current methods rely on a vector-based framework that can handle only up to four independent components, often leading to inefficiencies and inaccuracies. We introduce Three-Dimensional Spatially Resolved Lock-In Micro-Thermography (3D SR-LIT), a novel optical thermal characterization technique combining a 3D tensor-based framework with an efficient area-detection experimental system. For simple tensors (e.g., x-cut quartz, k_xz=k_yz=0), our method reduces uncertainty by over 50% compared to vector-based methods. For complex tensors with six independent components (e.g., AT-cut quartz), 2σ uncertainties remain below 12% for all components. A novel adaptive mapping approach enables high-throughput data acquisition (40 seconds to 3 minutes, depending on tensor complexity), over 35 times faster than current methods, and accommodates samples with 200 nm surface roughness. Extensive numerical validation on 1,000 arbitrary anisotropic tensors ranging from 1 to 1,000 Wm^(-1) K^(-1) further validates the robustness of this methodology. This work highlights significant advancements in thermal characterization of complex anisotropic materials.
References in corpus (8)
- Black phosphorus field-effect transistors
- Recent Advances and Applications of Deep Learning Methods in Materials Science
- Anisotropic Thermal Conductivity in Single Crystal beta-Gallium Oxide
- Revealing the Anisotropic Thermal Conductivity of Black Phosphorus using the Time-Resolved Magneto-Optical Kerr Effect
- A new elliptical-beam method based on time-domain thermoreflectance (TDTR) to measure the in-plane anisotropic thermal conductivity and its comparison with the beam-offset method
- A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity
- Spatially resolved lock-in micro-thermography (SR-LIT): A tensor analysis-enhanced method for anisotropic thermal characterization
- Comprehensive Measurement of Three-Dimensional Thermal Conductivity Tensor Using a Beam-Offset Square-Pulsed Source (BO-SPS) Approach