Competing dynamics of single phosphorus dopant in graphene with electron irradiation
arXiv:1803.01369 · doi:10.1126/sciadv.aav2252
Abstract
Atomic-level structural changes in materials are important but challenging to study. Here, we demonstrate the dynamics and the possibility of manipulating a phosphorus dopant atom in graphene using scanning transmission electron microscopy (STEM). The mechanisms of various processes are explored and compared with those of other dopant species by first-principles calculations. This work paves the way for designing a more precise and optimized protocol for atomic engineering.
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- Electron-beam Introduction of Heteroatomic Pt-Si Structures in Graphene
- Creation of single vacancies in hBN with electron irradiation
- Doping of Cr in Graphene Using Electron Beam Manipulation for Functional Defect Engineering
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