A new method for measuring excess carrier lifetime in bulk silicon: Photoexcited muon spin spectroscopy

Abstract

We have measured the optically injected excess carrier lifetime in silicon using photoexcited muon spin spectroscopy. Positive muons implanted deep in a wafer can interact with the excess carriers and directly probe the bulk carrier lifetime whilst minimizing the effect from surface recombination. The method is based on the relaxation rate of muon spin asymmetry, which depends on the excess carrier concentration. The underlying microscopic mechanism has been understood by simulating the four-state muonium model in Si under illumination. We apply the technique to different injection levels and temperatures, and demonstrate its ability for injection- and temperature-dependent lifetime spectroscopy.

6 pages, 5 figures, and Supplemental Material

References in corpus (2)

• Mantid - Data Analysis and Visualization Package for Neutron Scattering and $\mu SR$ Experiments
• The new high field photoexcitation muon spectrometer at the ISIS pulsed neutron and muon source

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