Spin injection and detection up to room temperature in Heusler~alloy/-GaAs spin valves
arXiv:1610.03797 · doi:10.1103/PhysRevB.94.235309
Abstract
We have measured the spin injection efficiency and spin lifetime in CoFeSi/-GaAs lateral nonlocal spin valves from 20 to 300 K. We observe large (40 V) spin valve signals at room temperature and injector currents of A/cm, facilitated by fabricating spin valve separations smaller than the 1 m spin diffusion length and applying a forward bias to the detector contact. The spin transport parameters are measured by comparing the injector-detector contact separation dependence of the spin valve signal with a numerical model accounting for spin drift and diffusion. The apparent suppression of the spin injection efficiency at the lowest temperatures reflects a breakdown of the ordinary drift-diffusion model in the regime of large spin accumulation. A theoretical calculation of the D'yakonov-Perel spin lifetime agrees well with the measured -GaAs spin lifetime over the entire temperature range.
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References in corpus (13)
- Electrical Detection of Spin Transport in Lateral Ferromagnet-Semiconductor Devices
- Electronic measurement and control of spin transport in Silicon
- Tunneling Spin Injection into Single Layer Graphene
- Tunneling Spin Injection into Single Layer Graphene (Supplementary Information)
- Electrical Detection of Spin Accumulation at a Ferromagnet-Semiconductor Interface
- Reversal of spin polarization in Fe/GaAs (001) driven by resonant surface states: First-principles calculations
- Spin extraction theory and its relevance to spintronics
- Impurity-assisted tunneling magnetoresistance under weak magnetic field
- Observation of intrinsic inverse spin Hall effect
- Bias-controlled sensitivity of ferromagnet/semiconductor electrical spin detectors
- Spin lifetimes and strain-controlled spin precession of drifting electrons in zinc blende type semiconductors
- Bias-dependent electron spin lifetimes in n-GaAs and the role of donor impact ionization
- Theory of electrical spin-detection at a ferromagnet/semiconductor interface