Dissipation Mechanisms in Thermomechanically Driven Silicon Nitride Nanostrings
arXiv:1201.1898 · doi:10.1063/1.4704914
Abstract
High-stress silicon nitride nanostrings are a promising system for sensing applications because of their ultra-high mechanical quality factors (Qs). By performing thermomechanical calibration across multiple vibrational modes, we are able to assess the roles of the various dissipation mechanisms in these devices. Specifically, we possess a set of nanostrings in which all measured modes fall upon a single curve of peak displacement versus frequency. This allows us to rule out bulk bending and intrinsic loss mechanisms as dominant sources of dissipation and to conclude that the most significant contribution to dissipation in high-stress nanostrings occurs at the anchor points.
4 pages (+3 supplementary), 3 figures, accepted to Applied Physics Letters
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- Dissipation Mechanisms in Thermomechanically Driven Silicon Nitride Nanostrings
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- Nanoscale Torsional Optomechanics
- Dissipation Mechanisms in Thermomechanically Driven Silicon Nitride Nanostrings
- High-Q Gold and Silicon Nitride Bilayer Nanostrings
- Time-Resolved Mass Sensing of a Molecular Adsorbate Nonuniformly Distributed Along a Nanomechnical String
- Nano-beam clamping revisited
- On the link between mechanics and thermal properties: mechanothermics