Revealing the grain structure of graphene grown by chemical vapor deposition

Abstract

The physical processes occurring in the presence of disorder: point defects, grain boundaries, etc. may have detrimental effects on the electronic properties of graphene. Here we present an approach to reveal the grain structure of graphene by the selective oxidation of defects and subsequent atomic force microscopy analysis. This technique offers a quick and easy alternative to different electron microscopy and diffraction methods and may be used to give quick feedback on the quality of graphene samples grown by chemical vapor deposition.

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Cited by in corpus (5)

• Polycrystalline graphene and other two-dimensional materials
• Single-step deposition of high-mobility graphene at reduced temperatures
• Revealing the grain structure of graphene grown by chemical vapor deposition
• Intrinsic Energy Dissipation in CVD-Grown Graphene Nanoresonators
• Scattering by linear defects in graphene: a continuum approach