Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip
arXiv:0901.4331 · doi:10.1140/epjd/e2009-00001-5
Abstract
We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the surface and to the wire. Different regimes are observed, where loss rate is determined either by the technical current noise in the wire or the Johnson-Nyquist noise in the metallic gold layer, in good agreement with theoretical predictions. Far from the surface, we observe exceptionally long trapping times for an atom-chip, in the 10-minutes range.
5 pages
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- Johnson-Nyquist Noise Effects in Neutron Electric-Dipole-Moment Experiments
- The design of an experimental platform for hybridization of atomic and superconducting quantum systems
- Trapping neutral atoms in the field of a vortex pinned by a superconducting nano-disc