Epitaxial ferromagnetic FeSi/Si(111) structures with high-quality hetero-interfaces
arXiv:0810.2835 · doi:10.1063/1.2996581
Abstract
To develop silicon-based spintronic devices, we have explored high-quality ferromagnetic FeSi/silicon (Si) structures. Using low-temperature molecular beam epitaxy at 130 C, we realize epitaxial growth of ferromagnetic FeSi layers on Si (111) with keeping an abrupt interface, and the grown FeSi layer has the ordered phase. Measurements of magnetic and electrical properties for the FeSi/Si(111) yield a magnetic moment of ~ 3.16 /f.u. at room temperature and a rectifying Schottky-diode behavior with the ideality factor of ~ 1.08, respectively.
3 pages, 3 figures
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- Estimation of the spin polarization for Heusler-compound thin films by means of nonlocal spin-valve measurements: Comparison of CoFeSi and FeSi
- Large spin accumulation voltages in epitaxial Mn5Ge3 contacts on Ge without oxide tunnel barrier
- Atomically Controlled Epitaxial Growth of Single-Crystalline Germanium Films on a Metallic Silicide
- Giant enhancement of spin pumping efficiency using Fe3Si ferromagnet
- Room-temperature detection of spin accumulation in silicon across Schottky tunnel barriers using a MOSFET structure
- Epitaxial Growth of a Full-Heusler Alloy CoFeSi on Silicon by Low-Temperature Molecular Beam Epitaxy