Electronic structure of the SrTiO${}_3$/LaAlO${}_3$ interface revealed by resonant soft x-ray scattering

Abstract

We investigated the electronic structure of the SrTiO${}_3$/LaAlO${}_3$ superlattice (SL) by resonant soft x-ray scattering. The (003) peak, which is forbidden for our "ideal" SL structure, was observed at all photon energies, indicating reconstruction at the interface. From the peak position analyses taking into account the effects of refraction, we obtained evidence for electronic reconstruction of Ti 3d and O $2p$ states at the interface. From reflectivity analyses, we concluded that the AlO${}_2$/LaO/TiO${}_2$/SrO and the TiO${}_2$/SrO/AlO${}_2$/LaO interfaces are quite different, leading to highly asymmetric properties.

arXiv comment5 pages, 4 figures

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• Localized vs. delocalized character of charge carriers in LaAlO3/ SrTiO3 superlattices
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• Hydrostatic pressure response of an oxide two-dimensional electron system
• The importance of inter-site coherences in the x-ray absorption spectra of mixed-valent systems
• Ultrafast energy-dispersive soft-x-ray diffraction in the water window with a laser-driven source