Optical Measurement of the Phase-Breaking Length in Graphene
arXiv:0802.3709
Abstract
This paper reports the experimental determination of the phase-breaking length L of conduction electrons in graphene using Raman spectroscopy. Based on the double-resonance model, we extract L from the spatial dependence of the D band susceptibility near the graphene edge. By using prior knowledge of sample properties and the excitation point-spread function we are able to determine the spatial variation of the Raman susceptibilities with high accuracy, and the results reveal a phase-breaking length L~40nm near the graphene edge.
arXiv comment5 pages, 2 figures
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- Raman spectroscopy as a versatile tool for studying the properties of graphene
- Quantifying defects in graphene via Raman spectroscopy at different excitation energies
- Graphene plasmonics: A platform for strong light-matter interaction
- Structural analysis of polycrystalline graphene systems by Raman spectroscopy
- Calculation of the Raman G peak intensity in monolayer graphene: role of Ward identities