Electron energy loss spectroscopy determination of Ti oxidation state at the (001) LaAlO3/SrTiO3 interface as a function of LaAlO3 growth conditions
arXiv:0712.0223 · doi:10.1209/0295-5075/82/17003
Abstract
At the (001) interface between the two band-insulators LaAlO3 and SrTiO3, a high-mobility electron gas may appear, which has been the object of numerous works over the last four years. Its origin is a subject of debate between the interface polarity and unintended doping. Here we use electron energy loss 'spectrum images', recorded in cross-section in a scanning transmission electron microscope, to analyse the Ti3+ ratio, characteristic of extra electrons. We find an interface concentration of Ti3+ that depends on growth conditions.
arXiv comment6 pages
References in corpus (6)
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Cited by in corpus (6)
- Mapping the Spatial Distribution of Charge Carriers in LaAlO3/SrTiO3 Heterostructures
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- Pulsed laser deposition of SrTiO3/LaGaO3 and SrTiO3/LaAlO3: plasma plume effects
- Interface relaxation and electrostatic charge depletion in the oxide heterostructure LaAlO3/SrTiO3
- Influence of oxygen pressure and aging on LaAlO3 films grown by pulsed laser deposition on SrTiO3 substrates
- Tuning of metal-insulator transition of two-dimensional electrons at parylene/SrTiO interface by electric field