output
20072025
most citedUnderstanding metric-related pitfalls in image analysis validation

204 citations

researchers with a paper here

Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.

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Showing 2020 · stat.MEShow all

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stat.ME2020★ 4 cited

A linear noise approximation for stochastic epidemic models fit to partially observed incidence counts

Jonathan Fintzi, Jon Wakefield, Vladimir N. Minin

Stochastic epidemic models (SEMs) fit to incidence data are critical to elucidating outbreak dynamics, shaping response strategies, and preparing for future epidemics. SEMs typical…