507 citations
Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.
- Massachusetts Institute of TechnologyUS17 papers
- Khalifa University of Science and TechnologyAE13 papers
- MIT Media LabUS7 papers
- Kyoto UniversityJP5 papers
- University of EdinburghGB5 papers
- Centre National de la Recherche ScientifiqueFR4 papers
- Research Institute for Mathematical Sciences, Kyoto UniversityJP4 papers
- Cardiff UniversityGB3 papers
- Chinese University of Hong KongHK3 papers
- National Research University Higher School of EconomicsRU3 papers
- Rutgers, The State University of New JerseyUS3 papers
- The University of TokyoJP3 papers
4 papers · 1 filter
Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
Zheng Zhang, Tarek A. El-Moselhy, Ibrahim +2
Uncertainties have become a major concern in integrated circuit design. In order to avoid the huge number of repeated simulations in conventional Monte Carlo flows, this paper pres…
Calculation of Generalized Polynomial-Chaos Basis Functions and Gauss Quadrature Rules in Hierarchical Uncertainty Quantification
Zheng Zhang, Tarek A. El-Moselhy, Ibrahim +2
Stochastic spectral methods are efficient techniques for uncertainty quantification. Recently they have shown excellent performance in the statistical analysis of integrated circui…
Efficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuits
Zheng Zhang, Tarek A. El-Moselhy, Paolo Maffezzoni +3
This brief paper proposes an uncertainty quantification method for the periodic steady-state (PSS) analysis with both Gaussian and non-Gaussian variations. Our stochastic testing f…
Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques
Zheng Zhang, Xiu Yang, Giovanni Marucci +5
Process variations are a major concern in today's chip design since they can significantly degrade chip performance. To predict such degradation, existing circuit and MEMS simulato…