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19972026
most citedMaterials with Colossal Dielectric Constant: Do They Exist?

921 citations

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149 papers · 1 filter

cond-mat.mtrl-sci2026

STM study of single phosphorus incorporation into silicon by heating PBr3 on Si(100)

Tatiana V. Pavlova, Vladimir M. Shevlyuga

The objective of miniaturizing doped areas in silicon, with the ultimate goal of achieving atomic-precision doping, requires a fundamental understanding of the dopant incorporation…

cond-mat.mtrl-sci2026

Terahertz optical activity near crystal field transitions of Tm3+ ions in magnetoelectric alumoborates

A. M. Kuzmenko, V. Yu. Ivanov, S. V. Garnov +5

Crystal field (CF) excitations in the ground multiplet of Tm ions were investigated using terahertz transmission spectra of magnetoelectric TmAl(BO) and…

cond-mat.mtrl-sci2025★ 2 cited

Vacancy diffusion on a brominated Si(100) surface: Critical effect of the dangling bond charge state

T. V. Pavlova, V. M. Shevlyuga

Silicon dangling bonds (DBs) on an adsorbate-covered Si(100) surface can be created in a scanning tunneling microscope (STM) with high precision required for a number of applicatio…

cond-mat.mtrl-sci2025★ 6 cited

PBr3 Adsorption and Dissociation on the Si(100) Surface

Vladimir M. Shevlyuga, Yulia A. Vorontsova, Tatiana V. Pavlova

The adsorption of PBr3 on the Si(100)-21 surface was studied by scanning tunneling microscopy (STM) and density functional theory (DFT). The PBr3 molecule completely dissoc…

cond-mat.mtrl-sci2025★ 1 cited

Transitions between positive and negative charge states of dangling bonds on a halogenated Si(100) surface

T. V. Pavlova, V. M. Shevlyuga

Dangling bonds (DBs) are common defects in silicon that affect its electronic performance by trapping carriers at the in-gap levels. For probing the electrical properties of indivi…

cond-mat.mtrl-sci2025★ 2 cited

Calculations of pathways of precise P incorporation into chlorinated Si(100) surface

T. V. Pavlova

The precise incorporation of a phosphorus atom into a silicon surface is essential for the fabrication of nanoelectronic devices in which the active area is formed from single impu…