28 citations
- Yokohama National UniversityJP5 papers
- National Institute of Information and Communications TechnologyJP4 papers
- Kyushu UniversityJP2 papers
- The University of TokyoJP2 papers
- Centre National de la Recherche ScientifiqueFR1 paper
- Maastricht UniversityNL1 paper
- Nagoya UniversityJP1 paper
- Takeda (Japan)JP1 paper
- Tokyo Metropolitan UniversityJP1 paper
- Universidade de São PauloBR1 paper
- Universidade Federal de São CarlosBR1 paper
- Université Joseph FourierFR1 paper
Showing 2016Show all
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physics.optics2016★ 2 cited
Optical nano artifact metrics using silicon random nanostructures
Tsutomu Matsumoto, Naoki Yoshida, Shumpei Nishio +4
Nano artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Thin…
physics.data-an2016★ 4 cited
Eigenanalysis of morphological diversity in silicon random nanostructures formed via resist collapse
Makoto Naruse, Morihisa Hoga, Yasuyuki Ohyagi +4
This paper demonstrates eigenanalysis to quantitatively reveal the diversity and capacity of identities offered by the morphological diversity in silicon nanostructures formed via…