4 citations · 6 across the 2 of their papers we have counts for
2 papers
physics.optics2016★ 2 cited
Optical nano artifact metrics using silicon random nanostructures
Tsutomu Matsumoto, Naoki Yoshida, Shumpei Nishio +4
Nano artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Thin…
physics.data-an2016★ 4 cited
Eigenanalysis of morphological diversity in silicon random nanostructures formed via resist collapse
Makoto Naruse, Morihisa Hoga, Yasuyuki Ohyagi +4
This paper demonstrates eigenanalysis to quantitatively reveal the diversity and capacity of identities offered by the morphological diversity in silicon nanostructures formed via…