most citedNano-artifact metrics based on random collapse of resist

28 citations · 63 across the 5 of their papers we have counts for

collaborators

5 papers

physics.optics2016★ 2 cited

Optical nano artifact metrics using silicon random nanostructures

Tsutomu Matsumoto, Naoki Yoshida, Shumpei Nishio +4

Nano artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Thin…

physics.data-an2016★ 4 cited

Eigenanalysis of morphological diversity in silicon random nanostructures formed via resist collapse

Makoto Naruse, Morihisa Hoga, Yasuyuki Ohyagi +4

This paper demonstrates eigenanalysis to quantitatively reveal the diversity and capacity of identities offered by the morphological diversity in silicon nanostructures formed via…

physics.optics2014★ 17 cited

Randomness in highly reflective silver nanoparticles and their localized optical fields

Makoto Naruse, Takeharu Tani, Hideki Yasuda +3

Reflection of near-infrared light is important for preventing heat transfer in energy saving applications. A large-area, mass-producible reflector that contains randomly distribute…

cs.CR2014★ 28 cited

Nano-artifact metrics based on random collapse of resist

Tsutomu Matsumoto, Morihisa Hoga, Yasuyuki Ohyagi +7

Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate na…

physics.optics2014★ 12 cited

Unidirectional light propagation through two-layer nanostructures based on optical near-field interactions

Makoto Naruse, Hirokazu Hori, Satoshi Ishii +7

We theoretically demonstrate direction-dependent polarization conversion efficiency, yielding unidirectional light transmission, through a two-layer nanostructure by using the angu…