28 citations · 46 across the 4 of their papers we have counts for
4 papers
Optical nano artifact metrics using silicon random nanostructures
Tsutomu Matsumoto, Naoki Yoshida, Shumpei Nishio +4
Nano artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Thin…
Eigenanalysis of morphological diversity in silicon random nanostructures formed via resist collapse
Makoto Naruse, Morihisa Hoga, Yasuyuki Ohyagi +4
This paper demonstrates eigenanalysis to quantitatively reveal the diversity and capacity of identities offered by the morphological diversity in silicon nanostructures formed via…
Nano-artifact metrics based on random collapse of resist
Tsutomu Matsumoto, Morihisa Hoga, Yasuyuki Ohyagi +7
Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate na…
Unidirectional light propagation through two-layer nanostructures based on optical near-field interactions
Makoto Naruse, Hirokazu Hori, Satoshi Ishii +7
We theoretically demonstrate direction-dependent polarization conversion efficiency, yielding unidirectional light transmission, through a two-layer nanostructure by using the angu…