activity
19952015
most citedCarbon Nanotube Field-Effect Transistors With Integrated Ohmic Contacts and High-k Gate Dielectrics

540 citations · 2.1k across the 12 of their papers we have counts for

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Showing cond-mat.mes-hallShow all

6 papers · 1 filter

cond-mat.mes-hall2013★ 16 cited

Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs

Jiangjiang J. Gu, Xinwei Wang, Heng Wu +2

High performance InGaAs gate-all-around (GAA) nanowire MOSFETs with channel length (Lch) down to 20nm have been fabricated by integrating a higher-k LaAlO3-based gate stack with an…

cond-mat.mes-hall2012★ 32 cited

20-80nm Channel Length InGaAs Gate-all-around Nanowire MOSFETs with EOT=1.2nm and Lowest SS=63mV/dec

J. J. Gu, X. W. Wang, H. Wu +5

In this paper, 20nm - 80nm channel length (Lch) InGaAs gate- all-around (GAA) nanowire MOSFETs with record high on- state and off-state performance have been demonstrated by equiva…

cond-mat.mes-hall2012★ 54 cited

Size-dependent Transport Study of In0.53Ga0.47As Gate-all-around Nanowire MOSFETs: Impact of Quantum Confinement and Volume Inversion

Jiangjiang J. Gu, Heng Wu, Yiqun Liu +3

InGaAs gate-all-around nanowire MOSFETs with channel length down to 50nm have been experimentally demonstrated by top-down approach. The nanowire size-dependent transport propertie…

cond-mat.mes-hall2011★ 100 cited

First Experimental Demonstration of Gate-all-around III-V MOSFET by Top-down Approach

Jiangjiang Gu, Yiqun Liu, Yanqing Wu +3

The first inversion-mode gate-all-around (GAA) III-V MOSFETs are experimentally demonstrated with a high mobility In0.53Ga0.47As channel and atomic-layer-deposited (ALD) Al2O3/WN g…

cond-mat.mes-hall2003★ 540 cited

Carbon Nanotube Field-Effect Transistors With Integrated Ohmic Contacts and High-k Gate Dielectrics

Ali Javey, Jing Guo, Damon B. Farmer +5

High performance enhancement mode semiconducting carbon nanotube field-effect transistors (CNTFETs) are obtained by combining ohmic metal-tube contacts, high dielectric constant Hf…

cond-mat.mes-hall2003★ 174 cited

A Low-Temperature Atomic Layer Deposition Liftoff Method for Microelectronic and Nanoelectronic Applications

M. J. Biercuk, D. J. Monsma, C. M. Marcus +2

We report a novel method for depositing patterned dielectric layers with sub-micron features using atomic layer deposition (ALD). The patterned films are superior to sputtered or e…