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C. English

3 papers hereh-index 101.2k citations24 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author1
  • middle author2

Across the 3 of 3 papers where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall3

identity via Semantic Scholar / OpenAlex

most citedImproved Contacts to MoS2 Transistors by Ultra-High Vacuum Metal Deposition

548 citations · 548 across the 3 of their papers we have counts for

collaborators

3 papers

cond-mat.mes-hall2021

Improving Electric Contacts to Two-Dimensional Semiconductors

Saurabh V. Suryavanshi, Blanka Magyari-Kope, Paul Lim +4

Electrical contact resistance to two-dimensional (2D) semiconductors such as monolayer MoS_{2} is a key bottleneck in scaling the 2D field effect transistors (FETs). The 2D semicon…

cond-mat.mes-hall2021

Scaling Theory of Two-Dimensional Field Effect Transistors

Saurabh V. Suryavanshi, Chris D. English, H. -S. P. Wong +1

We present a scaling theory of two-dimensional (2D) field effect transistors (FETs). For devices with channel thickness less than 4 nm, the device electrostatics is dominated by th…

cond-mat.mes-hall2016★ 548 cited

Improved Contacts to MoS2 Transistors by Ultra-High Vacuum Metal Deposition

Chris D. English, Gautam Shine, Vincent E. Dorgan +2

The scaling of transistors to sub-10 nm dimensions is strongly limited by their contact resistance (Rc). Here we present a systematic study of scaling MoS2 devices and contacts wit…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.