292 citations · 498 across the 6 of their papers we have counts for
6 papers
High frequency Scanning Gate Microscopy and local memory effect of carbon nanotube transistors
Cristian Staii, Rui Shao, Dawn A. Bonnell +1
We use impedance spectroscopy to measure the high frequency properties of single-walled carbon nanotube field effect transistors (swCN-FETs). Furthermore, we extend Scanning Gate M…
Controlled Fabrication of Nanogaps in Ambient Environment for Molecular Electronics
D. R. Strachan, D. E. Smith, D. E. Johnston +4
We have developed a controlled and highly reproducible method of making nanometer-spaced electrodes using electromigration in ambient lab conditions. This advance will make feasibl…
Electric scanning probe imaging and modification of ferroelectric surfaces
Sergei V. Kalinin, Dawn A. Bonnell
Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of f…
Tip-gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices
Sergei V. Kalinin, Dawn A. Bonnell, Marcus Freitag +1
Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe…
Role of Single Defects in Electronic Transport through Carbon Nanotube Field-Effect Transistors
Marcus Freitag, Sergei V. Kalinin, Dawn A. Bonnell +1
The influence of defects on electron transport in single-wall carbon nanotube field effect transistors (CNFETs) is probed by combined scanning gate microscopy (SGM) and scanning im…
Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies
Sergei V. Kalinin, Marcus Freitag, A. T. Johnson +1
Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions. Applicability of SSPM…