13 citations · 13 across the 2 of their papers we have counts for
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cond-mat.mtrl-sci2005★ 13 cited
High frequency Scanning Gate Microscopy and local memory effect of carbon nanotube transistors
Cristian Staii, Rui Shao, Dawn A. Bonnell +1
We use impedance spectroscopy to measure the high frequency properties of single-walled carbon nanotube field effect transistors (swCN-FETs). Furthermore, we extend Scanning Gate M…
cond-mat.mtrl-sci2003
Electric scanning probe imaging and modification of ferroelectric surfaces
Sergei V. Kalinin, Dawn A. Bonnell
Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of f…