292 citations · 498 across the 6 of their papers we have counts for
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Tip-gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices
Sergei V. Kalinin, Dawn A. Bonnell, Marcus Freitag +1
Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe…
Role of Single Defects in Electronic Transport through Carbon Nanotube Field-Effect Transistors
Marcus Freitag, Sergei V. Kalinin, Dawn A. Bonnell +1
The influence of defects on electron transport in single-wall carbon nanotube field effect transistors (CNFETs) is probed by combined scanning gate microscopy (SGM) and scanning im…
Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies
Sergei V. Kalinin, Marcus Freitag, A. T. Johnson +1
Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions. Applicability of SSPM…