300 citations · 308 across the 3 of their papers we have counts for
3 papers
cond-mat.mtrl-sci2015★ 300 cited
A new LEED Instrument for Quantitative Spot Profile Analysis
U. Scheithauer, G. Meyer, M. Henzler
A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspectio…
physics.ins-det2014★ 7 cited
Characterisation of the primary X-ray source of an XPS microprobe Quantum 2000
U. Scheithauer
The outstanding design feature of an XPS microprobe Quantum 2000 is the double focussing ellipsoidally shaped quartz monochromator of the X-ray source. This device monochromatizes…
cond-mat.mtrl-sci2013★ 1 cited
Sputter-Induced Cross-Contaminations in Analytical AES and XPS Instrumentation: Utilization of the effect for the In-situ Deposition of Ultrathin Functional Layers
Uwe Scheithauer
Cross contaminations are observed on sample surfaces by AES and XPS, if multiple samples are mounted on one sample holder and a neighbouring sample was sputter depth profiled. Duri…