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20132017
most citedA new LEED Instrument for Quantitative Spot Profile Analysis

300 citations · 311 across the 4 of their papers we have counts for

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cond-mat.mtrl-sci2013★ 1 cited

Sputter-Induced Cross-Contaminations in Analytical AES and XPS Instrumentation: Utilization of the effect for the In-situ Deposition of Ultrathin Functional Layers

Uwe Scheithauer

Cross contaminations are observed on sample surfaces by AES and XPS, if multiple samples are mounted on one sample holder and a neighbouring sample was sputter depth profiled. Duri…