300 citations · 311 across the 4 of their papers we have counts for
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cond-mat.mtrl-sci2015★ 300 cited
A new LEED Instrument for Quantitative Spot Profile Analysis
U. Scheithauer, G. Meyer, M. Henzler
A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspectio…
cond-mat.mtrl-sci2013★ 1 cited
Sputter-Induced Cross-Contaminations in Analytical AES and XPS Instrumentation: Utilization of the effect for the In-situ Deposition of Ultrathin Functional Layers
Uwe Scheithauer
Cross contaminations are observed on sample surfaces by AES and XPS, if multiple samples are mounted on one sample holder and a neighbouring sample was sputter depth profiled. Duri…