most citedHeterointerface effects on the charging energy of shallow D- ground state in silicon: the role of dielectric mismatch

29 citations · 103 across the 5 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci201027 cited

Drain current modulation in a nanoscale field-effect-transistor channel by single dopant implantation

B. C. Johnson, G. C. Tettamanzi, A. D. C. Alves +9

We demonstrate single dopant implantation into the channel of a silicon nanoscale metal-oxide-semiconductor field-effect-transistor. This is achieved by monitoring the drain curren…

cond-mat.mes-hall201029 cited

Heterointerface effects on the charging energy of shallow D- ground state in silicon: the role of dielectric mismatch

M. J. Calderon, J. Verduijn, G. P. Lansbergen +3

Donor states in Si nanodevices can be strongly modified by nearby insulating barriers and metallic gates. We report here experimental results indicating a strong reduction in the c…

cond-mat.mes-hall201010 cited

Thermionic Emission as a tool to study transport in undoped nFinFETs

Giuseppe C. Tettamanzi, Abhijeet Paul, Gabriel P. Lansbergen +6

Thermally activated sub-threshold transport has been investigated in undoped triple gate MOSFETs. The evolution of the barrier height and of the active cross-section area of the ch…

cond-mat.supr-con201011 cited

Flux noise in ion-implanted nanoSQUIDs

Giuseppe C. Tettamanzi, Christopher I. Pakes, Simon K. H. Lam +1

Focused ion beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs which incorporate resistively-shunted microbridge junctions and a central loop with a hole diame…

cond-mat.mes-hall201026 cited

Superconducting transition in Nb nanowires fabricated using focused ion beam

G. C. Tettamanzi, C. I. Pakes, A. Potenza +3

Making use of focused Ga-ion beam (FIB) fabrication technology, the evolution with device dimension of the low-temperature electrical properties of Nb nanowires has been examined i…