22 citations · 34 across the 7 of their papers we have counts for
7 papers
Deciphering Noise in tip--sample Interactions: Insights into Nanoscale Dynamics
Jaime Colchero, Juan F. González-Martínez
Noise sets the fundamental limits of resolution and sensitivity in Dynamic Atomic Force Microscopy (DAFM). While thermal fluctuations are conventionally assumed to be the dominant…
In-situ characterization of contamination within an Atomic Force Microscope tip-sample system
J. Sánchez, L. Almonte, J. Colchero
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as w…
Charging of highly resistive granular metal films
M. F. Orihuela, M. Ortuno, A. M. Somoza +4
We have used the Scanning Kelvin probe microscopy technique to monitor the charging process of highly resistive granular thin films. The sample is connected to two leads and is sep…
Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
José Abad, Juan Francisco González Martínez, Jaime Colchero Paetz
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on th…
Calibration of oscillation amplitude in Dynamic Scanning Force Microscopy
Juan Francisco González Martínez, Inés Nieto Carvajal, Jaime Colchero Paetz
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process t…
Nanoscale measurement of the Power Spectral Density of surface roughness: a difficult experimental challenge and how to solve it
Juan Francisco González Martínez, Inés Nieto Carvajal, José Abad +1
In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surf…