22 citations · 34 across the 7 of their papers we have counts for
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cond-mat.mes-hall2017★ 1 cited
In-situ characterization of contamination within an Atomic Force Microscope tip-sample system
J. Sánchez, L. Almonte, J. Colchero
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as w…
cond-mat.mes-hall2017★ 3 cited
Charging of highly resistive granular metal films
M. F. Orihuela, M. Ortuno, A. M. Somoza +4
We have used the Scanning Kelvin probe microscopy technique to monitor the charging process of highly resistive granular thin films. The sample is connected to two leads and is sep…