22 citations · 34 across the 7 of their papers we have counts for
5 papers · 1 filter
Deciphering Noise in tip--sample Interactions: Insights into Nanoscale Dynamics
Jaime Colchero, Juan F. González-Martínez
Noise sets the fundamental limits of resolution and sensitivity in Dynamic Atomic Force Microscopy (DAFM). While thermal fluctuations are conventionally assumed to be the dominant…
Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
José Abad, Juan Francisco González Martínez, Jaime Colchero Paetz
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on th…
Calibration of oscillation amplitude in Dynamic Scanning Force Microscopy
Juan Francisco González Martínez, Inés Nieto Carvajal, Jaime Colchero Paetz
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process t…
Nanoscale measurement of the Power Spectral Density of surface roughness: a difficult experimental challenge and how to solve it
Juan Francisco González Martínez, Inés Nieto Carvajal, José Abad +1
In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surf…
Discrimination and analysis of interactions in non-contact Scanning Force Microscopy
Elisa Palacios-Lidon, Jaime Colchero
A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy…